smartctl 6.4 2015-06-04 r4109 [x86_64-linux-3.18.31-gentoo-kf0] (local build) Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital RE2-GP Device Model: WDC WD1000FYPS-01ZKB0 Serial Number: WD-WCASJ1638785 LU WWN Device Id: 5 0014ee 2019259e1 Firmware Version: 02.01B01 User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.5, 3.0 Gb/s Local Time is: Fri Sep 30 21:34:41 2016 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (27180) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 311) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x303f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0003 241 181 021 Pre-fail Always - 4950 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 265 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 007 007 000 Old_age Always - 68260 10 Spin_Retry_Count 0x0012 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 260 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 319 193 Load_Cycle_Count 0x0032 001 001 000 Old_age Always - 3714566 194 Temperature_Celsius 0x0022 116 093 000 Old_age Always - 36 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 5420 hours (225 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 72 5d 59 40 Error: UNC at LBA = 0x00595d72 = 5856626 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 58 62 10 7e 0c 00 17:33:35.342 READ FPDMA QUEUED 60 12 e8 00 59 10 11 00 17:33:35.341 READ FPDMA QUEUED 60 76 88 8a 59 10 11 00 17:33:35.341 READ FPDMA QUEUED 60 08 40 42 5f b1 0d 00 17:33:35.340 READ FPDMA QUEUED 61 10 88 52 5f b1 0d 00 17:33:35.338 WRITE FPDMA QUEUED Error 1 occurred at disk power-on lifetime: 4750 hours (197 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 a2 66 f4 40 Error: UNC at LBA = 0x00f466a2 = 16017058 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 18 70 12 5c 10 11 00 9d+01:42:54.762 READ FPDMA QUEUED 60 08 10 12 d8 0f 11 00 9d+01:42:54.755 READ FPDMA QUEUED 60 08 10 72 da 0f 11 00 9d+01:42:54.753 READ FPDMA QUEUED 60 08 68 4a a0 ad 10 00 9d+01:42:54.744 READ FPDMA QUEUED 60 02 68 00 8f ad 10 00 9d+01:42:54.741 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.